SPC: Beyond X-bar and R Charts (18 十月 2013)
There is a golden chance for you to learn more about advanced tools of Minitab! Top-notch Minitab professional, Dr. Scott Kowalski, will come to Hong Kong to share his valuable views on Control Charts such as EWMA, Rare Events, Laney P’, Between-Within. Please check the details as shown below:
講座:
日期: 18 十月 2013 (Fri)
時間: 7:00PM - 8:30下午
項目: SPC: Beyond X-bar and R Charts
備注: Priority will be given to Registered Professionals of SSI first, SSI students on second
Abstract:
統計過程控制 (SPC) is a powerful tool for exploring and controlling processes. It has been a proven tool for many years. With the advancement of Lean Six Sigma, many companies are using X-bar and R control charts to stay competitive. However, there are many control charts that can be effectively used in SPC. This talk will introduce some of the other available control charts and provide examples where they can be used in practice.
About Dr. Scott Kowalski:
Dr. Scott Kowalski earned his Ph.D. in Statistics from the University of Florida, where he taught several courses and concentrated on design of experiments and response surface methodology. He has been a Technical Trainer at Minitab Inc. since 2001 and currently works with Minitab’s international partners on their certified training programs. Scott is on the Editorial review board of the Journal of Quality Technology 及 Quality Engineering. He has published articles in Journal of Quality Technology, Quality Engineering, Quality Reliability Engineering International, Technometrics, 及 Quality Progress. Scott was awarded the 2005 Lloyd Nelson Award by ASQ for the paper having “the greatest immediate impact to practitioners”. In addition to his extensive teaching experience and research, he has delivered presentations and seminars at meetings of professional organizations including the American Statistical Association, the Fall Technical Conference of the American Society for Quality’s Statistics Division, and many Six Sigma events in Asia.
課程報名
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